Достижения в области визуализации и электронной физики: Том 1

TOWAR WYSYŁAMY Z POLSKI

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

• Autor: Hawkes Peter
• Wydawnictwo: Academic Press
• Data wydania: 2010
• Wydanie: 1
• Liczba stron: 304
• Forma publikacji: Oprawa twarda
• Język publikacji: Angielski
• ISBN: 9780123813183

1. Charged particles in electromagnetic fields 2. Language of aberration expansions in charged particle optics 3. Transporting charged particle beams in static fields 4. Transporting charged particles in radiofrequency fields 5. Static magnetic charged particle analyzers 6. Electrostatic energy analyzers 7. Mass analyzers with combined electrostatic and magnetic fields 8. Time-of-flight mass analyzers 9. Radiofrequency mass analyzers